Evaluating edge loss in the reflectance measurement of translucent materials
Author:
Funder
Région Auvergne-Rhône-Alpes
Agence Nationale de la Recherche
European Metrology Programme for Innovation and Research
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering
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1. An adaptive parameterization for efficient material acquisition and rendering
2. A translucency classification for computer graphics;Gerardin,2019
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