Study on the mechanism of a charge-coupled device detector irradiated by millisecond pulse laser under functional loss
Author:
Publisher
The Optical Society
Reference12 articles.
1. Pointwise automatic analysis of speckle photographs
2. Mechanisms for laser-induced functional damage to silicon charge-coupled imaging sensors
3. A dazzling phenomenon of CW laser on linear CCD camera
4. Laser-induced damages to charge coupled device detector using a high-repetition-rate and high-peak-power laser
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1. Temporal and Spatial Distribution Characteristics of Crosstalk Lines Generated by Irradiating Progressive Scan Charge-Coupled Device Camera with Continuous Laser;Sensors;2024-06-19
2. Damage effect evaluation of CCD irradiated by laser based on multi-source information fusion;Optics Express;2024-05-02
3. Laser-induced damages to charge coupled devices with combined nanosecond/picosecond short-pulse lasers;Frontiers in Physics;2024-04-10
4. Failure mechanisms of a silicon-based CMOS image sensor irradiated by a 1550 nm nanosecond laser;Optics Express;2024-01-26
5. Damage thresholds of silicon-based cameras for in-band and out-of-band laser expositions;Applied Optics;2022-03-21
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