Laser-induced damages to charge coupled device detector using a high-repetition-rate and high-peak-power laser

Author:

Gang Li,Hong-bin Shen,Li Li,Chu Zhang,Shao-juan Mao,Yuan-bo Wang

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference23 articles.

1. Laser-induced functional damage to silicon CCD sensor arrays;Becker;Proceedings of SPIE,1991

2. Research on soft damage of CCD induced by pulse laser;ZHOU;Laser Journal,2005

3. Experimental study of 532nm pulsed laser irradiating CCD;Shen;High Power Laser and Particle Beams,2009

4. Experiment study on the laser dazzling of CCD photoelectric detector;Wang;Laser Journal,2009

5. Laser-dazzling effects on TV-cameras: analysis of dazzling effects and experimental parameters weight assessment;Durécu;Proceedings of SPIE,2007

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