Analysis of junction temperature and modification of luminous flux degradation for white LEDs in a thermal accelerated reliability test
Author:
Funder
Chinese Academy of Sciences (CAS)
863 Program
Publisher
The Optical Society
Reference17 articles.
1. Thermal-Stability Comparison of Glass- and Silicone-Based High-Power Phosphor-Converted White-Light-Emitting Diodes Under Thermal Aging
2. White LED performance
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4. Solid-state lighting: failure analysis of white LEDs
5. Light degradation test and design of thermal performance for high-power light-emitting diodes
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