Measurement and Analysis of the Reflectance Spectra of SiP_2-Reference-Cited by-同舟云学术

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Measurement and Analysis of the Reflectance Spectra of SiP_2

Published:1972-09-01 Issue:9 Volume:11 Page:1928
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Barkley John R.

Publisher

The Optical Society

Reference6 articles.

1. Measurement of the de Haas-van Alphen Effect in the Pyrite-Type Structure SiP2

2. Preparation and properties of pyrite-type SiP2 and SiAs2

3. A Monochromatic Depolarizer*†

4. Measurement of the thickness and refractive index of very thin films and the optical properties of surfaces by ellipsometry

5. High-Sensitivity Piezoreflectivity

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Structure and growth of single crystal SiP 2 using flux method;Solid State Sciences;2014-11

2. Use of the Bibliography;Thermophysical Properties Research Literature Retrieval Guide 1900–1980;1982

3. 2.2.5 References for 2.2;Landolt-Börnstein - Group III Condensed Matter

4. 2.2.1.1 Survey;Landolt-Börnstein - Group III Condensed Matter

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