Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry-Reference-Cited by-同舟云学术

Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry

Published:2012-10-17 Issue:22 Volume:20 Page:24977
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Matsuyama Satoshi,Yokoyama Hikaru,Fukui Ryosuke,Kohmura Yoshiki,Tamasaku Kenji,Yabashi Makina,Yashiro Wataru,Momose Atsushi,Ishikawa Tetsuya,Yamauchi Kazuto

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference35 articles.

1. Full-field microimaging with 8 keV X-rays achieves a spatial resolutions better than 20 nm

2. Focusing of hard x-rays to 16 nanometers with a multilayer Laue lens

3. Hard x-ray nanoprobe based on refractive x-ray lenses

4. Efficient focusing of hard x rays to 25nm by a total reflection mirror

5. Breaking the 10 nm barrier in hard-X-ray focusing

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