Generating random rough edges, surfaces, and volumes
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering
Reference17 articles.
1. Experimental and model-based study of the robustness of line-edge roughness metric extraction in the presence of noise
2. Line edge roughness and critical dimension variation: Fractal characterization and comparison using model functions
3. Nonlinear response of a silicon waveguide enhanced by a metal grating
4. Fast numerical method for electromagnetic scattering from an object above a large-scale layered rough surface at large incident angle: vertical polarization
5. Numerical modeling of acoustic‐wave scattering from randomly rough surfaces: an image model
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