Accurate and simultaneous measurement of thickness and refractive index of thermally evaporated thin organic films by surface plasmon resonance spectroscopy-Reference-Cited by-同舟云学术

Accurate and simultaneous measurement of thickness and refractive index of thermally evaporated thin organic films by surface plasmon resonance spectroscopy

Published:2014-07-29 Issue:16 Volume:22 Page:18914
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Del Rosso T.,Sánchez J. Edicson Hernández,Carvalho R. Dos Santos,Pandoli O.,Cremona M.

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference33 articles.

1. Surface Plasmon Resonance Sensors for Detection of Chemical and Biological Species

2. Spectroscopic investigation on the in situ polymerization of self assembled monolayers of carbazolyldiacetylene CDS9 on silver-coated glass

3. Surface Plasmon Resonance Studies of Gold and Silver Nanoparticles Linked to Gold and Silver Substrates by 2-Aminoethanethiol and 1,6-Hexanedithiol

4. Determination of thickness and dielectric constant of thin transparent dielectric layers using surface plasmon resonance

5. Two-color approach for determination of thickness and dielectric constant of thin films using surface plasmon resonance spectroscopy

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