Machine learning in analytical spectroscopy for nuclear diagnostics [Invited]

Author:

Rao Ashwin P.1ORCID,Jenkins Phillip R.2ORCID,Pinson Ryan E.1,Auxier II John D.3ORCID,Shattan Michael B.4ORCID,Patnaik Anil K.2ORCID

Affiliation:

1. Air Force Research Laboratory

2. Air Force Institute of Technology

3. Los Alamos National Laboratory

4. National Nuclear Security Administration

Abstract

Analytical spectroscopy methods have shown many possible uses for nuclear material diagnostics and measurements in recent studies. In particular, the application potential for various atomic spectroscopy techniques is uniquely diverse and generates interest across a wide range of nuclear science areas. Over the last decade, techniques such as laser-induced breakdown spectroscopy, Raman spectroscopy, and x-ray fluorescence spectroscopy have yielded considerable improvements in the diagnostic analysis of nuclear materials, especially with machine learning implementations. These techniques have been applied for analytical solutions to problems concerning nuclear forensics, nuclear fuel manufacturing, nuclear fuel quality control, and general diagnostic analysis of nuclear materials. The data yielded from atomic spectroscopy methods provide innovative solutions to problems surrounding the characterization of nuclear materials, particularly for compounds with complex chemistry. Implementing these optical spectroscopy techniques can provide comprehensive new insights into the chemical analysis of nuclear materials. In particular, recent advances coupling machine learning methods to the processing of atomic emission spectra have yielded novel, robust solutions for nuclear material characterization. This review paper will provide a summation of several of these recent advances and will discuss key experimental studies that have advanced the use of analytical atomic spectroscopy techniques as active tools for nuclear diagnostic measurements.

Funder

National Nuclear Security Administration

Los Alamos National Laboratory

Air Force Technical Applications Center

Defense Threat Reduction Agency

Air Force Office of Scientific Research

Publisher

Optica Publishing Group

Subject

Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering

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