Defects evaluation system for spherical optical surfaces based on microscopic scattering dark-field imaging method-Reference-Cited by-同舟云学术

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Defects evaluation system for spherical optical surfaces based on microscopic scattering dark-field imaging method

Published:2016-08-02 Issue:23 Volume:55 Page:6162
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Zhang Yihui,Yang Yongying,Li Chen,Wu Fan,Chai Huiting,Yan Kai,Zhou Lin,Li Yang,Liu Dong,Bai Jian,Shen Yibing

Funder

National Natural Science Foundation of China (NSFC)

State Key Laboratory of Modern Optical Instrumentation (MOI)

Publisher

The Optical Society

Reference28 articles.

1. The National Ignition Facility: enabling fusion ignition for the 21st century

2. Temperature dependence of luminescence for different surface flaws in high purity silica glass

3. Characterization of laser induced damage sites in optical components

4. Observation and morphology of small-scale laser induced damage

5. Role of Cracks, Pores, and Absorbing Inclusions on Laser Induced Damage Threshold at Surfaces of Transparent Dielectrics

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