Measurement of mean thickness of transparent samples using simultaneous phase shifting interferometry with four interferograms-Reference-Cited by-同舟云学术

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Measurement of mean thickness of transparent samples using simultaneous phase shifting interferometry with four interferograms

Published:2016-05-13 Issue:15 Volume:55 Page:4047
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Flores Muñoz V. H.,Arellano N.-I. Toto,Serrano García D. I.,Martínez García A.,Rodríguez Zurita G.,García Lechuga L.

Funder

Technological University of Tulancingo

Programa para el Desarrollo Profesional Docente (PRODEP)

Publisher

The Optical Society

Reference43 articles.

1. SNOP: a method for skeletonization of a fringe pattern along the fringe direction

2. Interactive Fringe processing algorithm for interferogram analysis

3. V Phase-Measurement Interferometry Techniques

4. Optical interferometry

5. III Interferometry with Lasers

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