Affiliation:
1. Korea Advanced Institute of Science and Technology (KAIST)
2. R&D Center, i3system, Inc.
Abstract
In this work, a new Python-based tool for atomic-scale mapping of high-angle annular dark-field (HAADF) and annular bright-field (ABF) scanning transmission electron microscopy (STEM) images using the Z-contrast method is introduced, aimed to help in the analysis of superlattice layers’ composition, and in the determination of material of interfaces. The operation principle of the program, as well as specific examples of use, are explained in many details. Good customization flexibility using the user-friendly graphical user interface (GUI), allows the processing of a wide range of images, demonstrating a decent accuracy of coordinates extraction and performance.
Funder
Civil-Military Technology Cooperation Program
Brain Korea 21 Program for Leading Universities & Students
Agency for Defense Development
Subject
Atomic and Molecular Physics, and Optics
Cited by
2 articles.
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