Relative error in out-of-plane measurement due to the object illumination
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics,Engineering (miscellaneous),Electrical and Electronic Engineering
Reference12 articles.
1. Measuring out-of-plane displacements by electronic speckle-pattern interferometry (ESPI) and whole-field subtractive moiré
2. Nondestructive Testing of Residual Stress on the Welded Part of Butt-welded A36 Plates Using Electronic Speckle Pattern Interferometry
3. Compact holographic optical element-based electronic speckle pattern interferometer for rotation and vibration measurements
4. Three-dimensional deformation measurement from the combination of in-plane and out-of-plane electronic speckle pattern interferometers
5. Use Of Electronic Speckle Pattern Interferometry (ESPI) In The Measurement Of Static And Dynamic Surface Displacements
Cited by 3 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Measurement in-plane deformations in electronic speckle pattern interferometry using phase-shifting modulated by polarization;Optics Communications;2021-11
2. Dynamic parallel phase-shifting electronic speckle pattern interferometer;Applied Optics;2020-09-14
3. Phase stepping through polarizing modulation in electronic speckle pattern interferometry;Applied Optics;2020-07-06
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