Measuring out-of-plane displacements by electronic speckle-pattern interferometry (ESPI) and whole-field subtractive moiré
Author:
Publisher
IOP Publishing
Subject
Applied Mathematics,Instrumentation,Engineering (miscellaneous)
Reference19 articles.
1. Experimental characterization of the local strain field in a heterogeneous elastoplastic material
2. Digital in-plane electronic speckle pattern shearing interferometry
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4. Measuring displacement derivatives by electronic speckle pattern shearing interferometry (ESPSI)
5. Holographic interferometry at LSA: Some selected examples of its application
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