Dielectric function and interband critical points of compressively strained ferroelectric K0.85Na0.15NbO3 thin film with monoclinic and orthorhombic symmetry

Abstract

The dielectric function and interband critical points of compressively strained ferroelectric K0.85Na0.15NbO3 thin film grown by metal-organic vapor phase epitaxy (MOVPE) are studied in broad spectral and temperature ranges by spectroscopic ellipsometry (SE). The temperature dependence of the measured pseudodielectric functions is strongly affected by a structural phase transition from the monoclinic Mc-phase to the orthorhombic c-phase at about 428 K. Using a parametric optical constant model, the corresponding dielectric functions as well as the interband optical transitions of the film are determined in the spectral range of 0.73–6.00 eV. Standard critical point (SCP) analysis of the 2nd derivatives of the dielectric functions identified three and four critical points for monoclinic and orthorhombic symmetries, respectively. A systematic redshift of the threshold energies with increasing temperatures was observed.