Grating-based at-wavelength metrology of hard x-ray reflective optics
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference14 articles.
1. ESRF metrology laboratory: overview of instrumentation, measurement techniques, and data analysis
2. Structured slope errors on real x-ray mirrors: ray tracing versus experiment
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5. X-ray wavefront analysis and optics characterization with a grating interferometer
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