Image enhancement in near-field scanning optical microscopy with laser-trapped metallic particles
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference12 articles.
1. Near-field scanning optical microscope with a metallic probe tip
2. Optical near‐field imaging with a semiconductor probe tip
3. Near-Field Scanning Optical Microscope with a Laser Trapped Probe
4. Two-color trapped-particle optical microscopy
5. Scanning-force microscope based on an optical trap
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