Scanning-force microscope based on an optical trap
Author:
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference6 articles.
1. Observation of a single-beam gradient force optical trap for dielectric particles
2. Optical measurement of picometer displacements of transparent microscopic objects
3. Atomic Force Microscope
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5. Determination of three-dimensional imaging properties of a light microscope system. Partial confocal behavior in epifluorescence microscopy
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