Sub-second infrared broadband-laser single-shot phase–amplitude polarimetry of thin films-Reference-Cited by-同舟云学术

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Sub-second infrared broadband-laser single-shot phase–amplitude polarimetry of thin films

Published:2019-08-29 Issue:17 Volume:44 Page:4387
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Furchner Andreas^ORCID,Kratz Christoph^ORCID,Hinrichs Karsten^ORCID

Funder

Europäischer Fonds für regionale Entwicklung (EFRE)

Ministerium für Innovation, Wissenschaft und Forschung des Landes Nordrhein-Westfalen

Regierende Bürgermeister von Berlin—Senatskanzlei Wissenschaft und Forschung

Bundesministerium für Bildung und Forschung

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference19 articles.

1. Instrumentation for FT-IR reflection spectroscopy with synchrotron radiation

2. Far-infrared ellipsometry using a synchrotron light source—the dielectric response of the cuprate high Tc superconductors

3. Ultrathin responsive polyelectrolyte brushes studied by infrared synchrotron mapping ellipsometry

4. Synchrotron radiation-based far-infrared spectroscopic ellipsometer with full Mueller-matrix capability

5. Quantum-Cascade Laser-Based Vibrational Circular Dichroism

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4. Towards Real-Time In-Situ Mid-Infrared Spectroscopic Ellipsometry in Polymer Processing;Polymers;2021-12-21

5. IR laser polarimetry: breaking limits of FTIR polarimetry for thin film studies;Optical Fibers and Sensors for Medical Diagnostics, Treatment and Environmental Applications XXI;2021-03-05

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