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Optical monitoring of nonquarterwave stacks

Published:1986-03-01 Issue:5 Volume:25 Page:753
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

van der Laan C. J.

Publisher

The Optical Society

Reference9 articles.

1. Turning Value Monitoring of Narrow-band All-dielectric Thin-film Optical Filters

2. Error Compensation Mechanisms in Some Thin-film Monitoring Systems

3. Monitoring of optical coatings

4. Nonquarterwave multilayer filters: optical monitoring with a minicomputer allowing correction of thickness errors

5. Optical thin film monitoring—Recent advances and limitations

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1. Noble Infrared Optical Thickness Monitoring System Based on the Algorithm of Phase-Locked Output Current–Reflectivity Coefficient;Coatings;2022-06-06

2. Self-compensation of errors in optical coating production with monochromatic monitoring;Optics Express;2021-12-17

3. A Polarizing Beam Splitting Coating Fabricated with the Use of the Wavelength-Indirect Broadband Optical Monitoring Method;Journal of Applied Spectroscopy;2020-01

4. Fabrication of broadband antireflection coatings using wavelength-indirect broadband optical monitoring;Optik;2018-03

5. Optical monitoring strategies for optical coating manufacturing;Optical Thin Films and Coatings;2018

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