Error Compensation Mechanisms in Some Thin-film Monitoring Systems
Author:
Affiliation:
1. a Laboratoire d'Optique, Centre d'Etude des Couches Minces (Associé au C.N.R.S.), Université d'Aix-Marseille, Saint Jérôme, 13397 Marseille Cedex 4, France
Publisher
Informa UK Limited
Subject
Electronic, Optical and Magnetic Materials
Link
https://www.tandfonline.com/doi/pdf/10.1080/713819668
Reference7 articles.
1. Turning Value Monitoring of Narrow-band All-dielectric Thin-film Optical Filters
2. Optical filters: Monitoring process allowing the auto-correction of thickness errors
3. Absorption in Turning Value Monitoring of Narrow Band Thin-film Optical Filters
4. The Effect of Errors in the Optical Monitoring of Narrow-band All-dielectric Thin Film Optical Filters
5. Towards invisible glass
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