Spectrally resolved white light interferometry to measure material dispersion over a wide spectral band in a single acquisition-Reference-Cited by-同舟云学术

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Spectrally resolved white light interferometry to measure material dispersion over a wide spectral band in a single acquisition

Published:2016-07-21 Issue:15 Volume:24 Page:17303
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Arosa Yago,Lago Elena López,Varela Luis Miguel,de la Fuente Raúl

Funder

Ministerio de Economía y Competitividad (MINECO)

Xunta de Galicia and FEDER

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference17 articles.

1. Absolute displacement measurements using modulation of the spectrum of white light in a Michelson interferometer

2. Dispersive white-light spectral interferometry to measure distances and displacements

3. Real time interferometric measurements of dispersion curves

4. Direct measurement of dispersion of the group refractive indices of quartz crystal by white-light spectral interferometry

5. Spectrally-resolved white-light interferometry as a profilometry tool

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1. Tailoring refractive index dispersion in ionic liquids: The influence of charge delocalization in cations;Spectrochimica Acta Part A: Molecular and Biomolecular Spectroscopy;2025-01

2. Theoretical Analysis of the Spectral Microscopy Interference with Low Coherence Light Source;2024

3. Tailoring Refractive Index Dispersion in Ionic Liquids: The Influence of Charge Delocalization in Cations;2024

4. Simultaneous Measurement of Group Refractive Index Dispersion and Thickness of Fused Silica Using a Scanning White Light Interferometer;Sensors;2023-12-19

5. A scattering spectrometer for white light interferometry;Optics and Lasers in Engineering;2023-10

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