Complete unambiguous optical characterization of double layers consisting of two strongly absorbing thin films by combined reflection and transmission ellipsometry
Author:
Publisher
The Optical Society
Reference24 articles.
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3. Prism spectroscopic ellipsometer;Thin Solid Films;2004-05
4. Ellipsometry of Thin Film Systems;Progress in Optics;2000
5. Ellipsometry in Electrochemistry;Modern Aspects of Electrochemistry;1993
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