Weakly absorbing layers: interferometric determination of their optical parameters
Author:
Publisher
The Optical Society
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1. On partially absorbing layers and interference;Journal of Modern Optics;2002-07
2. Interference method for determination of the refractive index and thickness;Optical Engineering;2000-09-01
3. Interferometric Methods for the Determination of Thin-Film Parameters;Handbook of Optical Constants of Solids;1997
4. Use of spectrogoniometric—ellipsometric techniques for the determination of optical properties of films of trinitrofluorenone and poly-n-vinylcarbazole;Thin Solid Films;1995-07
5. Optical interference method to obtain thickness and refractive indices of a uniaxial medium;Review of Scientific Instruments;1994-08
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