Method for edge detection based on phase jump in a differential interferometer-Reference-Cited by-同舟云学术

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Method for edge detection based on phase jump in a differential interferometer

Published:1999-01-01 Issue:1 Volume:38 Page:152
ISSN:0003-6935
Container-title:Applied Optics
language:en
Short-container-title:Appl. Opt.

Author:

Zhou Weidong,Cai Lilong

Publisher

The Optical Society

Reference5 articles.

1. A Laser-Source Photo-Electric Microscope for Sensing Moving Scale Lines

2. Development of an Interferometer for Measurement of Linear Grating and Index Scales.

3. A 3-D noncontact trigger probe for coordinate measuring machines

4. Investigation of common-path interference profilometry

5. Optical heterodyne profilometry

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1. Superresolution in phase image of π-phase step on plasmonic metasurface using differential heterodyne microscope;Optical Engineering;2023-08-16

2. High-precision detection method for an object edge based on a position-sensitive detector;Applied Optics;2023-02-23

3. Surface topography measurement of microstructures near the lateral resolution limit via coherence scanning interferometry;Optics and Lasers in Engineering;2022-05

4. Realization of an All-Optical Zero toπCross-Phase Modulation Jump;Physical Review Letters;2009-01-05

5. Optimization and control of parameters of the optical scheme of a heterodyne differential microscope;Optics and Spectroscopy;2003-01

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