High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development-Reference-Cited by-同舟云学术

High resolution beam profiling of X-ray free electron laser radiation by polymer imprint development

Published:2017-11-22 Issue:24 Volume:25 Page:30686
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Rösner Benedikt^ORCID,Döring Florian,Ribič Primož R.,Gauthier David,Principi Emiliano,Masciovecchio Claudio,Zangrando Marco,Vila-Comamala Joan,De Ninno Giovanni,David Christian

Funder

Horizon 2020 Research and Innovation Programme

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference25 articles.

1. Simple technique for measurements of pulsed Gaussian-beam spot sizes

2. Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids

3. Spot size characterization of focused non-Gaussian X-ray laser beams

4. Fluence scan: an unexplored property of a laser beam

5. Soft x-ray free-electron laser induced damage to inorganic scintillators

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