Reflection zone plate wavelength-dispersive spectrometer for ultra-light elements measurements-Reference-Cited by-同舟云学术

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Reflection zone plate wavelength-dispersive spectrometer for ultra-light elements measurements

Published:2015-11-03 Issue:23 Volume:23 Page:29476
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Hafner Aljoša,Anklamm Lars,Firsov Anatoly,Firsov Alexander,Löchel Heike,Sokolov Andrey,Gubzhokov Renat,Erko Alexei

Funder

BMBF

BMWi

Seventh Framework Programme (FP7)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference9 articles.

1. Off-axis reflection zone plate for quantitative soft x-ray source characterization

2. Novel parallel vacuum ultra-violet/X-ray fluorescence spectrometer

3. New parallel wavelength-dispersive spectrometer based on scanning electron microscope

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. High‐resolution x‐ray emission spectrometry in the lithium K range with a reflection zone plate spectrometer;X-Ray Spectrometry;2024-04-17

2. Periodic Multilayer for X-ray Spectroscopy in the Li K Range;Applied Sciences;2021-07-10

3. Soft X-ray spectroscopy with transition-edge sensors at Stanford Synchrotron Radiation Lightsource beamline 10-1;Review of Scientific Instruments;2019-11-01

4. Diffraction compensation of slope errors on strongly curved grating substrates;Advances in Metrology for X-Ray and EUV Optics VIII;2019-10-02

5. Novel x-ray optical systems for ultrafast spectroscopy and monochromators;Advances in Laboratory-based X-Ray Sources, Optics, and Applications VII;2019-10-01

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