Parallel light configuration that increases the radiation tolerance of integrated circuits
Author:
Funder
Ministry of Education, Culture, Sports, Science and Technology (MEXT)
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference12 articles.
1. Preliminary Radiation Testing of a State-of-the-Art Commercial 14nm CMOS Processor / System-on-a-Chip;Szabo,2015
2. Fully-depleted submicron SOI for radiation hardened applications
3. Analysis of TID Process, Geometry, and Bias Condition Dependence in 14-nm FinFETs and Implications for RF and SRAM Performance
4. Total Ionizing Dose Effects on DRAM Data Retention Time
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