Abstract
To overcome the shortcomings of the existing optical axis determination method’s optical path is a complex, cumbersome operation with difficulty in identifying criteria. According to Huygens’ drawing principle, this paper establishes a mathematical model between incident light and the outgoing distance of o-light and e-light, analyzes the optical system between the incident angle and refraction angle, deduces the relationship between the incident angle and the distance between two beams of light, designs a distinction scheme between o-light and e-light, proposes a distance method to determine the optical axis based on the difference between the two optical mathematical models, and verifies that although e-light does not meet the refraction law in birefringence, its optical path is reversible. The designed optical axis determination method is simpler, easier to operate, and simpler in identifying criteria than the existing optical path. The validity of the analysis is verified by experiments.
Funder
Research on the Error Accumulation Process and Accuracy Compensation Method of Pockels Effect Electric Field Measurement System under the Action of Transient Strong Electric Field project
Subject
Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics