Simultaneous detection of optical retardation and axis orientation by polarization-sensitive full-field optical coherence microscopy for material testing-Reference-Cited by-同舟云学术

Simultaneous detection of optical retardation and axis orientation by polarization-sensitive full-field optical coherence microscopy for material testing

Published:2014-03-18 Issue:5 Volume:11 Page:055602
ISSN:1612-2011
Container-title:Laser Physics Letters
language:
Short-container-title:Laser Phys. Lett.

Author:

Heise B,Buchroithner B,Schausberger S E,Hierzenberger P,Eder G,Stifter D

Publisher

IOP Publishing

Subject

Physics and Astronomy (miscellaneous),Instrumentation

Link

http://stacks.iop.org/1612-202X/11/i=5/a=055602/pdf

Reference24 articles.

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