Disparity pattern-based autostereoscopic 3D metrology system for in situ measurement of microstructured surfaces-Reference-Cited by-同舟云学术

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Disparity pattern-based autostereoscopic 3D metrology system for in situ measurement of microstructured surfaces

Published:2015-11-06 Issue:22 Volume:40 Page:5271
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Li Da,Cheung Chi Fai,Ren MingJun,Whitehouse David,Zhao Xing

Funder

Hong Kong Polytechnic University (Hong Kong PolyU)

Research Grants Council, University Grants Committee, Hong Kong (RGC, UGC)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference16 articles.

1. “Structured”, “Textured” or “Engineered” Surfaces

2. Ultraprecision micro-CMM using a low force 3D touch probe

3. On-Machine Measurementand Characterization of V-Groove Structure Pattern on Precision Rollers

4. In situ real-time measurement for micro-structured surfaces

5. Technological shifts in surface metrology

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