Influence of the thickness of a SiO2 reflective layer on the performance of a structured CsI(Tl) scintillation screen based on an oxidized Si micropore array template in X-ray imaging

Abstract

To obtain better light guidance and optical isolation effects under a limited microcolumn wall thickness, the influence of the thickness of a SiO2 reflective layer on the performance of a structured CsI(Tl) scintillation screen based on an oxidized Si micropore array template in X-ray imaging was simulated. The results show that the SiO2 reflective layer should maintain a certain thickness to achieve good light-guide performance. However, if the template is entirely composed of SiO2, the light isolation performance of the microcolumn wall will be slightly worse. The results provide a basis for optimizing the thickness of SiO2 reflective layer.