Near-field imaging and spectroscopy of locally strained GaN using an IR broadband laser-Reference-Cited by-同舟云学术

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Near-field imaging and spectroscopy of locally strained GaN using an IR broadband laser

Published:2014-09-09 Issue:19 Volume:22 Page:22369
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Bensmann Stefanie,Gaußmann Fabian,Lewin Martin,Wüppen Jochen,Nyga Sebastian,Janzen Christoph,Jungbluth Bernd,Taubner Thomas

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference40 articles.

1. Nanoscale polymer recognition by spectral signature in scattering infrared near-field microscopy

2. Infrared spectroscopic near-field mapping of single nanotransistors

3. Infrared Spectroscopic Mapping of Single Nanoparticles and Viruses at Nanoscale Resolution

4. Material-Specific Infrared Recognition of Single Sub-10 nm Particles by Substrate-Enhanced Scattering-Type Near-Field Microscopy

5. Nanoscale Resolved Infrared Probing of Crystal Structure and of Plasmon−Phonon Coupling

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4. Local phonon imaging of AlN nanostructures with nanoscale spatial resolution;Nanoscale Advances;2023

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