Mode-shape measurement of piezoelectric plate using temporal speckle pattern interferometry and temporal standard deviation
Author:
Funder
National Science Council of the Republic of China (NSCT)
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference11 articles.
1. Measurement of nano/micro out-of-plane and in-plane displacements of micromechanical components by using digital holography and speckle interferometry
2. Super-resolution digital speckle photography for micro/nano measurements
3. Electronic speckle-pattern interferometer using holographic optical elements for vibration measurements
4. Speckle Interferometry: A Review of the Principal Methods in Use for Experimental Mechanics Applications
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