Super-resolution digital speckle photography for micro/nano measurements
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Mechanical Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference15 articles.
1. Production of multiple beam fringes from photographic scatters;Burch;Opt Acta,1968
2. Displacement measurement from double exposure photography;Archbold;Opt Acta,1972
3. Strain analysis by one-beam laser speckle interferometry I; single aperture method;Khetan;Appl Opt,1976
4. Stress analysis by one-beam laser speckle interferometry II;Khetan;Appl Opt,1979
5. Theory and applications of the white light speckle method for strain analysis;Asundi;Opt Eng,1982
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