Focusing properties of hard x-ray photon sieves: three-parameter apodization window and waveguide effect-Reference-Cited by-同舟云学术

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Focusing properties of hard x-ray photon sieves: three-parameter apodization window and waveguide effect

Published:2009-09-30 Issue:19 Volume:34 Page:3038
ISSN:0146-9592
Container-title:Optics Letters
language:en
Short-container-title:Opt. Lett.

Author:

Xie Changqing,Zhu Xiaoli,Jia Jia

Funder

National Basic Research Program of China

National Synchrotron Radiation Laboratory, China

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference25 articles.

1. Soft X-ray microscopy at a spatial resolution better than 15 nm

2. Nanometer focusing of hard x rays by phase zone plates

3. Sub-100 nm Hard X-Ray Microbeam Generation with Fresnel Zone Plate Optics

4. Nanometer Linear Focusing of Hard X Rays by a Multilayer Laue Lens

5. Surface roughness of stainless-steel mirrors for focusing soft x rays

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