Statistical parameters for random and pseudorandom rough surfaces-Reference-Cited by-同舟云学术

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Statistical parameters for random and pseudorandom rough surfaces

Published:1988-01-01 Issue:1 Volume:5 Page:99
ISSN:1084-7529
Container-title:Journal of the Optical Society of America A
language:en
Short-container-title:J. Opt. Soc. Am. A

Author:

Rasigni G.,Llebaria A.,Rasigni M.,Palmari J.,Dussert C.,Varnier F.

Publisher

The Optical Society

Subject

Computer Vision and Pattern Recognition,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials

Reference15 articles.

1. Measurement of the rms roughness, autocovariance function and other statistical properties of optical surfaces using a FECO scanning interferometer

2. Stylus profiling instrument for measuring statistical properties of smooth optical surfaces

3. Die bestimmung der oberflächenrauhigkeit dünner schichten durch messung der winkelabhängigkeit der streustrahlung von oberflächenplasmaschwingungen

4. Study of surface roughness using a microdensitometer analysis of electron micrographs of surface replicas: I Surface profiles

5. Validity of surface-roughness study using microdensitometer analysis of electron micrographs of surface replicas

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