Tuning field depth at high resolution by pupil engineering
Author:
Funder
Consejo Nacional de Ciencia y Tecnología (CONACYT)
Publisher
The Optical Society
Subject
Atomic and Molecular Physics, and Optics
Reference240 articles.
1. Image processing for extended depth of field
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3. Focus-error operator and related special functions
4. Simple focusing criterion
5. Imaging with Fresnel zone pupil masks: extended depth of field
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