Surface plasmon enhanced differential reflectance technique for ultra-thin film monitoring-Reference-Cited by-同舟云学术

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Surface plasmon enhanced differential reflectance technique for ultra-thin film monitoring

Published:2013-05-20 Issue:6 Volume:30 Page:1590
ISSN:0740-3224
Container-title:Journal of the Optical Society of America B
language:en
Short-container-title:J. Opt. Soc. Am. B

Author:

Wang Ben-Li,Li Jia-Fang,Li Zhi-Yuan

Funder

973 Program of China

Chinese Academy of Sciences

National Natural Science Foundation of China

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics

Reference17 articles.

1. An Improved Method for High Reflectivity Ellipsometry Based on a New Polarization Modulation Technique

2. Adsorption and desorption kinetics of CO on Cu(110) studied by optical differential reflectance

3. An optical differential reflectance study of adsorption and desorption of xenon and deuterium on Ni(111)

4. Optical reflectance and electron diffraction studies of molecular-beam-epitaxy growth transients on GaAs(001)

5. Theoretical analysis of thin film epitaxial growth monitored by differential reflectance

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tunable coupling of a hybrid plasmonic waveguide consisting of two identical dielectric cylinders and a silver film;Chinese Physics B;2017-10

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