Absolute refractive index measurement method over a broad wavelength region based on white-light interferometry
Author:
Publisher
The Optical Society
Reference29 articles.
1. Ellipsometric determination of optical constants for silicon and thermally grown silicon dioxide via a multi-sample, multi-wavelength, multi-angle investigation
2. Measurement of Thin Film Parameters with a Prism Coupler
3. An Improved Recording Refractometer for Optical Glasses in the Wavelength Range 300 to 2600 nm
4. Some optical properties of KTP, LiIO/sub 3/, and LiNbO/sub 3/
5. Refractive index errors in the critical-angle and the Brewster-angle methods applied to absorbing and heterogeneous materials
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