Characterization of thin-film optical properties by THz near-field imaging method-Reference-Cited by-同舟云学术

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Characterization of thin-film optical properties by THz near-field imaging method

Published:2019-08-29 Issue:9 Volume:36 Page:2593
ISSN:0740-3224
Container-title:Journal of the Optical Society of America B
language:en
Short-container-title:J. Opt. Soc. Am. B

Author:

Amirkhan F.,Sakata R.,Takiguchi K.,Arikawa T.,Ozaki T.,Tanaka K.,Blanchard F.

Funder

Natural Sciences and Engineering Research Council of Canada

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics,Statistical and Nonlinear Physics

Reference39 articles.

1. A review of lithium niobate modulators for fiber-optic communications systems

2. Electronic analog of the electro‐optic modulator

3. Low-voltage, polarization-insensitive, electro-optic modulator based on a polydomain barium titanate thin film

4. Pulsed laser deposition of BaTiO3 thin films and their optical properties

5. Fabrication and optical characterization of Pb(Mg1/3Nb2/3)O3-PbTiO3 planar thin film optical waveguides

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1. Broadband heterodyne electro-optic sampling using a lithium niobate ridge-waveguide;Applied Physics Express;2024-04-01

2. Thin-film lithium niobate electro-optic terahertz wave detector;Scientific Reports;2024-02-27

3. An improved V-Net lung nodule segmentation model based on pixel threshold separation and attention mechanism;Scientific Reports;2024-02-27

4. Interplay between intervalley scattering and impact ionization induced by intense terahertz pulses in InSb thin films;Physical Review B;2024-01-08

5. High-throughput terahertz imaging: progress and challenges;Light: Science & Applications;2023-09-15

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