High-precision measurement of optical constants of ultra-thin coating using surface plasmon resonance spectroscopic ellipsometry in Otto-Bliokh configuration-Reference-Cited by-同舟云学术

High-precision measurement of optical constants of ultra-thin coating using surface plasmon resonance spectroscopic ellipsometry in Otto-Bliokh configuration

Published:2017-06-06 Issue:12 Volume:25 Page:13425
ISSN:1094-4087
Container-title:Optics Express
language:en
Short-container-title:Opt. Express

Author:

Hu Guohang,He Hongbo,Sytchkova Anna,Zhao Jiaoling,Shao Jianda,Grilli Marialuisa,Piegari Angela

Funder

Ministero degli Affari Esteri e della Cooperazione Internazionale

Ministry of Science and Technology of the People's Republic of China (MOST)

Publisher

The Optical Society

Subject

Atomic and Molecular Physics, and Optics

Reference16 articles.

1. Use of surface plasmon excitation for determination of the thickness and optical constants of very thin surface layers

2. Visualization of the complex refractive index of a conductor by frustrated total internal reflection

3. Measurements of complex refractive indices of metals at several wavelengths by frustrated total internal reflection due to surface plasmon resonance

4. Die Bestimmung optischer Konstanten von Metallen durch Anregung von Oberflächenplasmaschwingungen

5. Eine neue Methode der Anregung nichtstrahlender Oberflächenplasmaschwingungen

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