Use of surface plasmon excitation for determination of the thickness and optical constants of very thin surface layers
Author:
Publisher
Elsevier BV
Subject
Materials Chemistry,Surfaces, Coatings and Films,Surfaces and Interfaces,Condensed Matter Physics
Reference22 articles.
1. Ellipsometry in the sub-monolayer region
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4. Estimation of Dielectric Constant and Thickness of Copper Thin Films Using Surface Plasmon Resonance;Latin America Optics and Photonics Conference;2018
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