Porous silica xerogel films as antireflective coatings – Fabrication and characterization-Reference-Cited by-同舟云学术

Porous silica xerogel films as antireflective coatings – Fabrication and characterization

Published:2011-10 Issue:12 Volume:33 Page:1989-1994
ISSN:0925-3467
Container-title:Optical Materials
language:en
Short-container-title:Optical Materials

Author:

Karasiński Paweł,Jaglarz Janusz,Reben Manuela,Skoczek Edyta,Mazur Jacek

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials,Inorganic Chemistry,Organic Chemistry,Physical and Theoretical Chemistry,Spectroscopy

Reference19 articles.

1. C.J. Brinker, G.W. Scherer, in: Sol–gel Science: The Physics and Chemistry of Sol–Gel Processing, Academic Press, Inc., San Diego, 1990.

2. New method for making porous SiO2 thin films;Liu;Thin Solid Films,1999

3. Influence of aging and annealing on the properties of silica films produced with sol–gel method;Karasiński;Optica Applicata,2006

4. Preparation and characterization of thick porous SiO2 film for multilayer pyroelectric thin film IR detector;Li;Ceramic International,2004

5. Silica antireflective films on glass produced by the sol–gel method;Bautista;Solar Energy Materials & Solar Cells,2003

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