Surface morphological, structural, electrical and optical properties of GaN-based light-emitting diodes using submicron-scaled Ag islands and ITO thin films-Reference-Cited by-同舟云学术

Surface morphological, structural, electrical and optical properties of GaN-based light-emitting diodes using submicron-scaled Ag islands and ITO thin films

Published:2018-07 Issue: Volume:81 Page:109-114
ISSN:0925-3467
Container-title:Optical Materials
language:en
Short-container-title:Optical Materials

Author:

Lee Young-Woong,Reddy M. Siva Pratap,Kim Bo-Myung,Park Chinho

Funder

Korea Institute of Energy Technology Evaluation and Planning

Ministry of Trade, Industry and Energy, Republic of Korea

Ministry of Education

Publisher

Elsevier BV

Subject

Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials,Inorganic Chemistry,Organic Chemistry,Physical and Theoretical Chemistry,Spectroscopy

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