Dielectric and ferroelectric properties of highly (100)-oriented (Na0.5Bi0.5)0.94Ba0.06TiO3 thin films grown on LaNiO3/γ-Al2O3/Si substrates by chemical solution deposition-Reference-Cited by-同舟云学术

Dielectric and ferroelectric properties of highly (100)-oriented (Na0.5Bi0.5)0.94Ba0.06TiO3 thin films grown on LaNiO3/γ-Al2O3/Si substrates by chemical solution deposition

Published:2008-07 Issue:7 Volume:10 Page:928-933
ISSN:1293-2558
Container-title:Solid State Sciences
language:en
Short-container-title:Solid State Sciences

Author:

Guo Yiping,Akai Daisuke,Sawada Kazauki,Ishida Makoto

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Reference38 articles.

1. Materials issues in microelectromechanical systems (MEMS)

2. Preparation and Characterization of BaTiO3Thick Films with Li2O-SiO2Sintering Aid

3. Preparation of Ba(Ti,Zr)O3Thick-Film Microactuators on Silicon Substrates by Screen Printing

4. Ferroelectric thin films for micro-sensors and actuators: a review

5. {1 0 0}-Textured, piezoelectric Pb(Zrx, Ti1−x)O3 thin films for MEMS: integration, deposition and properties

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