Band-offset reduction for effective hole carrier collection in bifacial silicon heterojunction solar cells
Author:
Funder
Sungkyunkwan University
Publisher
Elsevier BV
Subject
Condensed Matter Physics,General Materials Science,General Chemistry
Reference16 articles.
1. Bifacial solar photovoltaics – a technology review;Guerrero;Renew. Sustain. Energy Rev.,2016
2. Bifacial n-type silicon solar cells for upconversion applications;Rudiger;Sol. Energy Mater. Sol. Cell.,2014
3. Bifacial photovoltaic panels field;Appelbaum;Renew. Energy,2016
4. Kinetics of a-Si:H bulk defect and a-Si:H/c-Si interface-state reduction;De Wolf;Phys. Rev. B,2012
5. Ultra-thin stack of n-type hydrogenated microcrystalline silicon and silicon oxide front contact layer for rear-emitter silicon heterojunction solar cells;Pham;Mater. Sci. Semicond. Process.,2019
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