Thin-film formation of Si clathrates on Si wafers-Reference-Cited by-同舟云学术

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Thin-film formation of Si clathrates on Si wafers

Published:2014-04 Issue:4 Volume:75 Page:518-522
ISSN:0022-3697
Container-title:Journal of Physics and Chemistry of Solids
language:en
Short-container-title:Journal of Physics and Chemistry of Solids

Author:

Ohashi Fumitaka,Iwai Yoshiki,Noguchi Akihiro,Sugiyama Tomoya,Hattori Masashi,Ogura Takuya,Himeno Roto,Kume Tetsuji,Ban Takayuki,Nonomura Shuichi

Funder

Japan Science and Technology AgencyJapan Science and Technology Agency (JST)

Publisher

Elsevier BV

Subject

Condensed Matter Physics,General Materials Science,General Chemistry

Reference30 articles.

1. Clathrates of Group 14 with Alkali Metals: An Exploration

2. Semiconducting clathrates: synthesis, structure and properties

3. X-ray absorption spectroscopy studies of local structure and electronic properties ofNaxSi136(0

4. NMR studies of Na atoms in silicon clathrate compounds

5. Theoretical investigation of alkali-metal doping in Si clathrates

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1. Influence of Sodium Concentration on the Optoelectronic Properties of Silicon Clathrate Films;ACS Applied Energy Materials;2024-09-13

2. Tunability of silicon clathrate film properties by controlled guest-occupation of their cages;The Journal of Chemical Physics;2023-04-25

3. Synthesis and optical properties of Ge clathrate films with and without Al doping;Japanese Journal of Applied Physics;2023-01-23

4. Synthesis and characterization of silicon clathrates of type I Na8Si46 and type II NaxSi136 by thermal decomposition;Journal of Alloys and Compounds;2022-05

5. Synthesis and characterization of type II silicon clathrate films with low Na concentration;Applied Physics Reviews;2021-12

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