Influence of Sodium Concentration on the Optoelectronic Properties of Silicon Clathrate Films-Reference-Cited by-同舟云学术

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Influence of Sodium Concentration on the Optoelectronic Properties of Silicon Clathrate Films

Published:2024-09-13 Issue: Volume: Page:
ISSN:2574-0962
Container-title:ACS Applied Energy Materials
language:en
Short-container-title:ACS Appl. Energy Mater.

Author:

Bharwal Anil Kumar¹^ORCID,Vollondat Romain¹,Tamin Charif²,Roques Stéphane¹,Bartringer Jérémy¹,Stoeffler Daniel³^ORCID,Chevalier Céline²,Dinia Aziz³,Slaoui Abdelilah¹,Fix Thomas¹

Affiliation:

1. ICube Laboratory, University of Strasbourg and CNRS, Strasbourg 67037, France

2. CNRS, Ecole Centrale de Lyon, INSA Lyon, Université Claude Bernard Lyon 1, CPE Lyon, INL, UMR5270, Villeurbanne 69100, France

3. IPCMS Laboratory, University of Strasbourg and CNRS, Strasbourg 67037, France

Funder

Agence Nationale de la Recherche

Publisher

American Chemical Society (ACS)

Link

https://pubs.acs.org/doi/pdf/10.1021/acsaem.4c01514

Reference60 articles.

1. Clathrate Structure of Silicon Na 8 Si 46 and Na x Si 136 ( x < 11)

2. NaSi and Si clathrate prepared on Si substrate

3. Thin film of guest-free type-II silicon clathrate on Si(111) wafer

4. Silicene: Compelling Experimental Evidence for Graphenelike Two-Dimensional Silicon

5. Synthesis of an open-framework allotrope of silicon

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