Absolute and comparative measurements of three-dimensional shape by phase measuring moiré topography
Author:
Publisher
Elsevier BV
Subject
Electrical and Electronic Engineering,Atomic and Molecular Physics, and Optics,Electronic, Optical and Magnetic Materials
Reference11 articles.
1. Moiré technique by means of digital image processing;Gasvik;Appl Opt,1983
2. Real-time fringe-pattern analysis;Mertz;Appl Opt,1983
3. Automatic evaluation of interferograms;Becker,1982
4. Fourier-transform method of fringe-pattern analysis for computer-based topography and interferometry;Takeda;J Opt Soc Am,1982
5. Interactive fringe analysis system: applications to moiré contourogram and interferogram;Yatagai;Opt Engg,1982
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